VLSI test principles and architectures : design for testability
By: Wu, Cheng-Wen.
Contributor(s): Wang, Laung-Terng | Wen, Xiaoqing.
Material type:
BookSeries: The Morgan Kaufmann series in systems on silicon.Publisher: Amsterdam: Elsevier, 2006Description: xxx, 777 p.; ill.: 24 cm.ISBN: 9780123705976 .Subject(s): Integrated circuits -- Very large scale integration -- Design | Integrated circuits -- Very large scale integration -- TestingDDC classification: 621.395
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Books | 621.395 WAN (Browse shelf) | Available | 019158 |
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